Phil Hobbs's Patents
Solar Photovoltaics
YOR920080708US1 IMMERSION SOLAR CONCENTRATOR (filed, not yet published)
Quantum Computing
YOR920080707US1: HYBRID SUPERCONDUCTOR OPTICAL QUANTUM REPEATER (filed, not yet published)
Optical Interconnection
US20080310808A1: PHOTONIC WAVEGUIDE STRUCTURE WITH PLANARIZED SIDEWALL CLADDING LAYER
US20080180340A1: WAVEGUIDE COUPLING DEVICES
US07542643B2: COUPLING ELEMENT ALIGNMENT USING WAVEGUIDE FIDUCIALS
US07480429: CHIP TO CHIP OPTICAL INTERCONNECT
US07421160: COUPLING ELEMENT USING WAVEGUIDE FIDUCIALS
US07412134: APPARATUS AND METHODS FOR REMAKEABLE CONNECTIONS TO OPTICAL WAVEGUIDES
US07197207: APPARATUS AND METHOD FOR OPTICAL INTERCONNECTION
US07116865: APPARATUS AND METHODS FOR REMAKEABLE CONNECTIONS TO OPTICAL WAVEGUIDES
US06983097: MAGNETO-OPTICAL SWITCHING BACKPLANE FOR PROCESSOR INTERCONNECTION
US06816637: MAGNETO-OPTICAL SWITCHING BACKPLANE FOR PROCESSOR INTERCONNECTION
Footprints: a network of distributed low-cost infrared imagers
US06614348: SYSTEM AND METHOD FOR MONITORING BEHAVIOR PATTERNS
US06449382: A METHOD AND SYSTEM FOR RECAPTURING A TRAJECTORY OF AN OBJECT
US06399946: PYROELECTRIC FILM SENSORS
Ultrasensitive Measurements
US05134276: NOISE CANCELLING CIRCUITRY FOR OPTICAL SYSTEMS WITH SIGNAL DIVIDING AND COMBINING MEANS
US06259712: INTERFEROMETER METHOD FOR PROVIDING STABILITY OF A LASER
US05648268: RADIONUCLIDE EXCHANGE DETECTION OF ULTRA TRACE IONIC IMPURITIES IN WATER
US05294806: OPTICAL SUBMICRON AEROSOL PARTICLE DETECTOR
US05204631: SYSTEM AND METHOD FOR AUTOMATIC THRESHOLDING OF SIGNALS IN THE PRESENCE OF GAUSSIAN NOISE
US05192870: OPTICAL SUBMICRON AEROSOL PARTICLE DETECTOR
US05133602: PARTICLE PATH DETERMINATION SYSTEM
Instruments for Manufacturing and Process Control
US06567172: SYSTEM AND MULTIPASS PROBE FOR OPTICAL INTERFERENCE MEASUREMENTS
US05691540: ASSEMBLY FOR MEASURING A TRENCH DEPTH PARAMETER OF A WORKPIECE
US05516608: METHOD FOR CONTROLLING A LINE DIMENSION ARISING IN PHOTOLITHOGRAPHIC PROCESSES
US05432670: GENERATION OF IONIZED AIR FOR SEMICONDUCTOR CHIPS
US05343290: SURFACE PARTICLE DETECTION USING HETERODYNE INTERFEROMETER
US05316970: GENERATION OF IONIZED AIR FOR SEMICONDUCTOR CHIPS
US05116583: SUPPRESSION OF PARTICLE GENERATION IN A MODIFIED CLEAN ROOM CORONA AIR IONIZER
Advanced Scanning Technology
US06118518: ASSEMBLY COMPRISING A POCKET 3-D SCANNER
US06057947: ENHANCED RASTER SCANNING ASSEMBLY
US05986759: OPTICAL INTERFEROMETER MEASUREMENT APPARATUS AND METHOD
US05908586: METHOD FOR ADDRESSING WAVEFRONT ABERRATIONS IN AN OPTICAL SYSTEM
US05794023: APPARATUS UTILIZING A VARIABLY DIFFRACTIVE RADIATION ELEMENT
US05638176: INEXPENSIVE INTERFEROMETRIC EYE TRACKING SYSTEM
Solid-Immersion Microscopy (NA=2.8 to 3.2)
US05220403: APPARATUS AND A METHOD FOR HIGH NUMERICAL APERTURE MICROSCOPIC EXAMINATION OF MATERIALS
US05208648: APPARATUS AND A METHOD FOR HIGH NUMERICAL APERTURE MICROSCOPIC EXAMINATION OF MATERIALS
Scanned-Probe Microscopy
US05298975: COMBINED SCANNING FORCE MICROSCOPE AND OPTICAL METROLOGY TOOL