Patents

Here's a list of links to PDFs of the patents on this site. A few of these cases were also filed overseas.

I also do a fair amount of expert witness work in patent and trade secret cases. I'm always interested in new work, so send me an email and let's talk about your application.

Solar Photovoltaics

US08569616 : METHOD OF CONCENTRATING SOLAR ENERGY US08026439 : SOLAR CONCENTRATOR SYSTEM

Quantum Computing

US07889992 : HYBRID SUPERCONDUCTOR OPTICAL QUANTUM REPEATER

Optical Interconnection

US08528805 : METHOD AND APPARATUS PROVIDING FINE ALIGNMENT OF A STRUCTURE US08104668B2 : METHOD AND APPARATUS PROVIDING FINE ALIGNMENT OF A STRUCTURE RELATIVE TO A SUPPORT US20080310808A1 : PHOTONIC WAVEGUIDE STRUCTURE WITH PLANARIZED SIDEWALL CLADDING LAYER US20080180340A1 : WAVEGUIDE COUPLING DEVICES US07857195B2 : METHOD AND APPARATUS PROVIDING FINE ALIGNMENT OF A STRUCTURE RELATIVE TO A SUPPORT US07841510 : METHOD AND APPARATUS PROVIDING FINE ALIGNMENT OF A STRUCTURE RELATIVE TO A SUPPORT US07542643B2 : COUPLING ELEMENT ALIGNMENT USING WAVEGUIDE FIDUCIALS US07480429 : CHIP TO CHIP OPTICAL INTERCONNECT US07421160 : COUPLING ELEMENT USING WAVEGUIDE FIDUCIALS US07412134 : APPARATUS AND METHODS FOR REMAKEABLE CONNECTIONS TO OPTICAL WAVEGUIDES US07197207 : APPARATUS AND METHOD FOR OPTICAL INTERCONNECTION US07116865 : APPARATUS AND METHODS FOR REMAKEABLE CONNECTIONS TO OPTICAL WAVEGUIDES US06983097 : MAGNETO-OPTICAL SWITCHING BACKPLANE FOR PROCESSOR INTERCONNECTION US06816637 : MAGNETO-OPTICAL SWITCHING BACKPLANE FOR PROCESSOR INTERCONNECTION

Footprints: a network of distributed low-cost infrared imagers

US06614348 : SYSTEM AND METHOD FOR MONITORING BEHAVIOR PATTERNS US06449382 : A METHOD AND SYSTEM FOR RECAPTURING A TRAJECTORY OF AN OBJECT US06399946 : PYROELECTRIC FILM SENSORS

Ultrasensitive Measurements

US05134276 : NOISE CANCELLING CIRCUITRY FOR OPTICAL SYSTEMS WITH SIGNAL DIVIDING AND COMBINING MEANS US06259712 : INTERFEROMETER METHOD FOR PROVIDING STABILITY OF A LASER US05648268 : RADIONUCLIDE EXCHANGE DETECTION OF ULTRA TRACE IONIC IMPURITIES IN WATER US05294806 : OPTICAL SUBMICRON AEROSOL PARTICLE DETECTOR US05204631 : SYSTEM AND METHOD FOR AUTOMATIC THRESHOLDING OF SIGNALS IN THE PRESENCE OF GAUSSIAN NOISE US05192870 : OPTICAL SUBMICRON AEROSOL PARTICLE DETECTOR US05133602 : PARTICLE PATH DETERMINATION SYSTEM

Instruments for Manufacturing and Process Control

US06567172 : SYSTEM AND MULTIPASS PROBE FOR OPTICAL INTERFERENCE MEASUREMENTS US05691540 : ASSEMBLY FOR MEASURING A TRENCH DEPTH PARAMETER OF A WORKPIECE US05516608 : METHOD FOR CONTROLLING A LINE DIMENSION ARISING IN PHOTOLITHOGRAPHIC PROCESSES US05432670 : GENERATION OF IONIZED AIR FOR SEMICONDUCTOR CHIPS US05343290 : SURFACE PARTICLE DETECTION USING HETERODYNE INTERFEROMETER US05316970 : GENERATION OF IONIZED AIR FOR SEMICONDUCTOR CHIPS US05116583 : SUPPRESSION OF PARTICLE GENERATION IN A MODIFIED CLEAN ROOM CORONA AIR IONIZER

Advanced Scanning Technology

US06118518 : ASSEMBLY COMPRISING A POCKET 3-D SCANNER US06057947 : ENHANCED RASTER SCANNING ASSEMBLY US05986759 : OPTICAL INTERFEROMETER MEASUREMENT APPARATUS AND METHOD US05908586 : METHOD FOR ADDRESSING WAVEFRONT ABERRATIONS IN AN OPTICAL SYSTEM US05794023 : APPARATUS UTILIZING A VARIABLY DIFFRACTIVE RADIATION ELEMENT US05638176 : INEXPENSIVE INTERFEROMETRIC EYE TRACKING SYSTEM

Solid-Immersion Microscopy (NA=2.8 to 3.2)

US05220403 : APPARATUS AND A METHOD FOR HIGH NUMERICAL APERTURE MICROSCOPIC EXAMINATION OF MATERIALS US05208648 : APPARATUS AND A METHOD FOR HIGH NUMERICAL APERTURE MICROSCOPIC EXAMINATION OF MATERIALS

Scanned-Probe Microscopy

US05298975 : COMBINED SCANNING FORCE MICROSCOPE AND OPTICAL METROLOGY TOOL