Viewing posts for the category Design Support Consulting

Integrating vs. TIA front ends for compressive-scan cameras

A shootout between the two major classes of transimpedance amplifier (TIA) designs for one difficult corner of the design space.

13.5 nm EUV Lithography: Tin Droplet Detection System

When you're hitting a droplet with enough pulsed CO2 light to generate X-rays efficiently, you have to know exactly when it's going to cross the focus.

RF Design for Ion Trap Mass Spectrometer RGA

Producing an integrated model of circuit conditions and ion motion, allowing optimization of circuit and excitation parameters, plus sanity checking