This is a very exciting development, in cooperation with a semiconductor equipment manufacturer, I'm building a visible-light scanning microscope with six times higher lateral resolution than is possible with a normal microscope. It's based on my Ph.D. thesis work and some things I did at IBM long ago.
Based in large part on my expert reports and reverse engineering of accused products, our Motion for Summary Judgment was granted. In the order, Judge Beverly O'Connell stated that the defendant "...has shown that Plaintiff has failed to produce evidence to support his claims for patent infringement."
Three interesting new engineering projects have come in: a microplate reader subsystem for water quality assays; a sensor front end with very stringent size, weight, and power (SWaP) constraints; and a scanning microscopy development system.
I've been retained by Banyan in a patent interference case regarding concentrator-type solar collectors.