I'm designing two brand new front ends for a scanning surface voltage tool for semiconductor manufacturing. Normally there are two ways you can measure surface potential—the vibrating Kelvin probe, which gets you the actual voltage but is very slow, or the fast-scan method, which is fast but gets you only the 1-D derivative of the potential.
Testifying defense expert in an action for patent infringement in GBIC optical transceivers. Advised and performed some reverse engineering.
(settled quickly in 2011)
I'm happy to announce that as of July 1, 2011, EOI is now in a larger and more convenient space, still in Briarcliff. As you can see in this photo tour, it provides a much larger lab area as well as a library/storage area and a second office for visitors and perhaps a colleague.